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Active layers in the thin-film solar cell

The image shows a cross-section of the active layers in the thin-film solar cell, with a total thickness of no more than 3 micrometres. Using nano-XRF measured at the MAX IV facility in Lund, it is possible to measure the concentration of both matrix elements and trace elements (in this case rubidium) in the solar cell with high accuracy.
Marika Edoff
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Marika Edoff
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Marika Edoff
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