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Active layers in the thin-film solar cell
The image shows a cross-section of the active layers in the thin-film solar cell, with a total thickness of no more than 3 micrometres. Using nano-XRF measured at the MAX IV facility in Lund, it is possible to measure the concentration of both matrix elements and trace elements (in this case rubidium) in the solar cell with high accuracy.
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Media Use
The content may be downloaded by journalists, bloggers, columnists, creators of public opinion, etc. It can be used and shared in different media channels to convey, narrate, and comment on your press releases, posts, or information, provided that the content is unmodified. The author or creator shall be attributed to the extent and in the manner required by good practice (this means, for example, that photographers should be attributed).
- By: Marika Edoff
- Copyright: Marika Edoff
- File format: .jpg
- Size: 964 x 542, 160 KB
